Optoelectronic Characterization (EE-0214)

Spring 2025 · EE 0214 · Tufts University · 3 credits · Undergraduate

Tools and techniques used to characterize optoelectronic materials and devices. Photoluminescence, ellipsometry, scanning probe microscopy, electron microscopy, and AC/DC electrical characterization. Theoretical underpinning of and practical experience with the measurement techniques. Laboratory.

Course codes: EE-0214, EE 0214, EE0214, EE-214, EE 214, EE214, MSE-0201, MSE 0201, MSE0201, MSE-201, MSE 201, MSE201

01-LEC (Lecture) — Pan Menasuta
LA-LAB (Lab) — Pan Menasuta

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